表面化学分析 二次离子质谱法 静态二次离子质谱法中相对强度标度的重现性和恒定性
Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
摘要: ISO 23830:2008 specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.
标准编号: ISO 23830-2008
发布单位: IX-ISO
发布日期: 2008年11月1日
状态: 现行
强制性标准:
实施日期: 2008年11月1日
开本页数: 12
中国标准分类号:
G G04
化工综合
国际标准分类号: 71 71.040.40